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InGaN stress compensation layers in InGaN/GaN blue LEDs with step graded electron injectors

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Akademik Birimler

Kurum Yazarları

Aydınlı, Atilla

Yazarlar

Sheremet, V.
Gheshlaghi, N.
Sözen, M.
Elçi, M.
Sheremet N.
Altuntaş, İsmail
Ding, Kai
Avrutin, Vitaliy
Özgür, Ümit
Morkoç̌, Hadis

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Academic Press Ltd Elsevier Science Ltd

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We investigate the effect of InGaN stress compensation layer on the properties of light emitting diodes based on InGaN/GaN multiple quantum well (MQW) structures with step graded electron injectors. Insertion of an InGaN stress compensation layer between n-GaN and the step graded electron injector provides, among others, strain reduction in the MQW region and as a result improves epitaxial quality that can be observed by 15-fold decrease of V-pit density. We observed more uniform distribution of In between quantum wells in MQW region from results of electro- and photoluminescence measurement. These structural improvements lead to increasing of radiant intensity by a factor of 1.7-2.0 and enhancement of LED efficiency by 40%.

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Konusu

Physics, Light-emitting diode, Step-graded electron injector, Stress compensation layer, InGaN/GaN, Light-emitting-diodes, Quantum-wells, Efficiency, Emission, Recombination, Localization, Luminescence, Dynamics, Origin, Electron injection, Electrons; III-V semiconductors, Indium alloys, Light emitting diodes, Semiconductor quantum wells, Electron injectors, Multiple quantum-well structures, Photoluminescence measurements, Radiant intensities, Stress compensation, Structural improvements, Uniform distribution, Gallium alloys

Alıntı

Sheremet, V. vd. (2018). ''InGaN stress compensation layers in InGaN/GaN blue LEDs with step graded electron injectors''. Superlattices and Microstructures, 116, 253-261.

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