Yayın:
Steganalysis using image quality metrics

dc.contributor.authorMemon, Nasir
dc.contributor.authorSankur, Bülent
dc.contributor.buuauthorAvcıbaş, İsmail
dc.contributor.departmentMühendislik Fakültesi
dc.contributor.departmentElektronik Mühendisliği Bölümü
dc.contributor.researcheridH-9089-2018
dc.date.accessioned2021-06-24T11:33:02Z
dc.date.available2021-06-24T11:33:02Z
dc.date.issued2003-02
dc.description.abstractWe present techniques for steganalysis of images that have been potentially subjected to steganographic algorithms, both within the passive warden and active warden frameworks. Our hypothesis is that steganographic schemes leave statistical evidence that can be exploited for detection with the aid of image quality features and multivariate regression analysis. To this effect image quality metrics have been identified based on the analysis of variance (ANOVA) technique as feature sets to distinguish between cover-images and stego-images. The classifier between cover and stego-images is built using multivariate regression on the selected quality metrics and is trained based on an estimate of the original image. Simulation results with the chosen feature set and well-known watermarking and steganographic techniques indicate that our approach is able with reasonable accuracy to distinguish between cover and stego images.
dc.identifier.citationMemon, N. vd. (2003). “Steganalysis using image quality metrics”. IEEE Transactions on Image Processing, 12(2), 221-229.
dc.identifier.doi10.1109/TIP.2002.807363
dc.identifier.endpage229
dc.identifier.issn1057-7149
dc.identifier.issue2
dc.identifier.pubmed18237902
dc.identifier.scopus2-s2.0-0038343416
dc.identifier.startpage221
dc.identifier.urihttps://doi.org/10.1109/TIP.2002.807363
dc.identifier.urihttps://pubmed.ncbi.nlm.nih.gov/18237902/
dc.identifier.urihttp://hdl.handle.net/11452/20834
dc.identifier.volume12
dc.identifier.wos000182032500010
dc.indexed.scopusScopus
dc.indexed.wosSCIE
dc.language.isoen
dc.publisherIEEE- Inst Electrical Electronics Engineers Inc.
dc.relation.collaborationYurt dışı
dc.relation.collaborationYurt içi
dc.relation.journalIEEE Transactions on Image Processing
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectAnalysis of variance
dc.subjectImage quality measures
dc.subjectMultivariate regression analysis
dc.subjectSteganalysis
dc.subjectSteganography
dc.subjectWatermarking
dc.subjectComputer science
dc.subjectEngineering
dc.subject.wosComputer science, artificial intelligence
dc.subject.wosEngineering, electrical & electronic
dc.titleSteganalysis using image quality metrics
dc.typeArticle
dc.wos.quartileQ1
dspace.entity.typePublication
local.contributor.departmentMühendislik Fakültesi/Elektronik Mühendisliği Bölümü
local.indexed.atWOS
local.indexed.atScopus

Dosyalar

Lisanslı seri

Şimdi gösteriliyor 1 - 1 / 1
Placeholder
Ad:
license.txt
Boyut:
1.71 KB
Format:
Item-specific license agreed upon to submission
Açıklama