Yayın: Steganalysis based on image quality metrics
Tarih
Kurum Yazarları
Avcıbaş, İsmail
Yazarlar
Memon, Niaz Ahmed
Sankur, Bülent
Danışman
Dil
Türü
Yayıncı:
IEEE
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Özet
In this paper, we present techniques for steganalysis of images that have been potentially subjected to a watermarking algorithm. We show that watermarking schemes leave statistical evidence or structure that can be exploited for detection with the aid of proper selection of image features and multivariate regression analysis. We use some image quality metrics as the feature set to distinguish between watermarked and unwatermarked images and furthermore distinguish between different watermarking techniques. To Identify specific quality measures that provide the best discriminative power, we use analysis of variance (ANOVA) techniques. Multivariate regression analysis Is then used on the selected quality metrics to build an optimal classifier using a set of test images and their blurred versions. Simulation results with a specific feature set and some well-known and publicly available watermarking techniques indicate that our approach is able to accurately distinguish with high accuracy between images marked by different watermarking techniques.
Açıklama
Bu çalışma, 4. Multimedia Signal Processing Workshop'da bildiri olarak sunulmuştur.
Kaynak:
Anahtar Kelimeler:
Konusu
Computer science
Alıntı
Avcıbaş, İ. vd. (2001). "Steganalysis based on image quality metrics". 2001 IEEE Workshop on Multimedia Signal Processing, 517-522.
