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Effect of the heavy ions to the silicon detectors

dc.contributor.buuauthorKılıç, Adnan
dc.contributor.departmentFen Edebiyat Fakültesi
dc.contributor.departmentFizik Bölümü
dc.contributor.researcheridAAH-8769-2021
dc.contributor.scopusid57210230921
dc.date.accessioned2024-01-08T07:05:17Z
dc.date.available2024-01-08T07:05:17Z
dc.date.issued2016
dc.description.abstractSilicon particle detectors are used in several applications such as accelerators in high energy physics, space, nuclear physics experiments and medicine. Thereby, it is crucially important to understand the effects of various particles with different energies on performance of silicon detectors. In this study, it has been focused on recoil heavy ions (Z >= 3) produced by 50 to 500 MeV protons in silicon. In order to investigate the effects of the recoil heavy ions on silicon, it has been simulated some physical quantities such as variety, ranges, linear energy transfers (LET) and non-ionizing energy loss (NIEL) of the recoil heavy ions through GEANT4 (Geometry And Tracking) [1], FLUKA (FLUktuierende KAskade) [2] and SRIM [3] Monte Carlo tools.
dc.identifier.citationKılıç, A. (2016). "Effect of the heavy ions to the silicon detectors". Romanian Journal of Physics, 61(5-6), 885-891.
dc.identifier.endpage891
dc.identifier.issn1221-146X
dc.identifier.issue5-6
dc.identifier.scopus2-s2.0-84981352020
dc.identifier.startpage885
dc.identifier.urihttps://s3.cern.ch/inspire-prod-files-5/5e3374e5520506e92e3277e9c9612556
dc.identifier.urihttps://hdl.handle.net/11452/38817
dc.identifier.volume61
dc.identifier.wos000381898000012
dc.indexed.wosSCIE
dc.language.isoen
dc.publisherEditura Academiei Romane
dc.relation.bapOUAP(F) - 2013/38
dc.relation.journalRomanian Journal of Physics
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectPhysics
dc.subjectLET
dc.subjectNIEL
dc.subjectIon
dc.subjectSilicon
dc.subjectGEANT4
dc.subjectFLUKA
dc.subjectSRIM
dc.subjectSimulation
dc.subjectNiel
dc.subject.scopusHeavy Ions; Fluence; Trapping
dc.subject.wosPhysics, multidisciplinary
dc.titleEffect of the heavy ions to the silicon detectors
dc.typeArticle
dc.wos.quartileQ2
dspace.entity.typePublication
local.contributor.departmentFen Edebiyat Fakültesi/Fizik Bölümü
local.indexed.atPubMed
local.indexed.atScopus

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