Publication:
Effect of Co and Cu layer thicknesses on characterization of electrodeposited Co/Cu multilayers

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dc.contributor.authorKoçkar, Hakan
dc.contributor.buuauthorHacıismailoğlu, Mürşide Şafak
dc.contributor.buuauthorAlper, Mürsel
dc.contributor.departmentFen Edebiyat Fakültesi
dc.contributor.departmentFizik Ana Bilim Dalı
dc.contributor.orcid0000-0001-5648-3230
dc.contributor.researcheridAAG-8795-2021
dc.contributor.researcheridAAH-9719-2021
dc.contributor.scopusid36482867500
dc.contributor.scopusid7005719283
dc.date.accessioned2023-05-12T11:40:55Z
dc.date.available2023-05-12T11:40:55Z
dc.date.issued2013-01
dc.description.abstractCo/Cu multilayers were grown on polycrystalline Cu substrates from a single electrolyte by electrodeposition potentiostatically. The structural, magnetic and magnetoresistance (MR) properties of the multilayers were characterized according to both Co and Cu layer thicknesses. The structural analysis by X-ray diffraction (XRD) showed that all samples have face-centered cubic (fcc) structure with a strong (100) texture. Magnetic characterizations studied by vibrating sample magnetometer (VSM) revealed that the easy axes of the multilayers are parallel to the film plane. From magnetoresistance (MR) measurements, it was observed that all samples exhibited giant magnetoresistance (GMR). The GMR behavior of the multilayers changes depending on the thicknesses of both Co and Cu layers.
dc.description.sponsorshipTürkiye Cumhuriyeti Kalkınma Bakanlığı - (2005K120170)
dc.description.sponsorshipAnadolu Üniversitesi
dc.identifier.citationHacıismailoğlu, M. Ş. vd. (2013). “Effect of Co and Cu layer thicknesses on characterization of electrodeposited Co/Cu multilayers”. Sensor Letters, 11(1), Special Issue, 106-109.
dc.identifier.endpage109
dc.identifier.issn1546-198X
dc.identifier.issn1546-1971
dc.identifier.issue1, Special Issue
dc.identifier.scopus2-s2.0-84877982043
dc.identifier.startpage106
dc.identifier.urihttps://doi.org/10.1166/sl.2013.2798
dc.identifier.urihttp://hdl.handle.net/11452/32648
dc.identifier.volume11
dc.identifier.wos000321593400026
dc.indexed.wosSCIE
dc.language.isoen
dc.publisherAmer Scientific Publishers
dc.relation.collaborationYurt içi
dc.relation.journalSensor Letters
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi
dc.relation.tubitakTBAG-1771
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectChemistry
dc.subjectElectrochemistry
dc.subjectInstruments & instrumentation
dc.subjectPhysics
dc.subjectElectrodeposition
dc.subjectGiant magnetoresistance
dc.subjectMultilayers
dc.subjectX ray diffraction
dc.subjectCo/Cu multilayers
dc.subjectFace centered cubic structure
dc.subjectGiant magnetoresistances (GMR)
dc.subjectGMR
dc.subjectMagnetoresistance measurements
dc.subjectMagnetoresistance properties
dc.subjectVibrating sample magnetometer
dc.subjectVSM
dc.subjectMagnetic multilayers
dc.subjectSuperlattices
dc.subject.scopusCopper; Coercivity; Saturation Magnetization
dc.subject.wosChemistry, analytical
dc.subject.wosElectrochemistry
dc.subject.wosInstruments & instrumentation
dc.subject.wosPhysics, applied
dc.titleEffect of Co and Cu layer thicknesses on characterization of electrodeposited Co/Cu multilayers
dc.typeArticle
dspace.entity.typePublication
local.contributor.departmentFen Edebiyat Fakültesi/Fizik Ana Bilim Dalı
local.indexed.atScopus
local.indexed.atWOS

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