Publication:
A dynamic method for charging-up calculations: The case of GEM

dc.contributor.authorCorreia, Pedro M. M.
dc.contributor.authorOliveira, Carlos A. B.
dc.contributor.authorAzevedo, C. D. R.
dc.contributor.authorSilva, Ana Luísa M.
dc.contributor.authorNemallapudi, Mythra Varun
dc.contributor.authorVeloso, J. F. C. A.
dc.contributor.buuauthorVeenhof, Robert J.
dc.contributor.departmentFen Edebiyat Fakültesi
dc.contributor.departmentFizik Bölümü
dc.contributor.scopusid6603742499
dc.date.accessioned2024-02-22T06:46:57Z
dc.date.available2024-02-22T06:46:57Z
dc.date.issued2014-06-26
dc.description.abstractThe simulation of Micro Pattern Gaseous Detectors (MPGDs) signal response is an important and powerful tool for the design and optimization of such detectors. However, several attempts to exactly simulate the effective gas gain have not been completely successful. Namely, the gain stability over time has not been fully understood. Charging-up of the insulator surfaces have been pointed as one of the responsible for the difference between experimental and Monte Carlo results. This work describes two iterative methods to simulate the charging-up in one MPGD device, the Gas Electron Multiplier (GEM). The first method, which uses a constant step size for avalanches time evolution, is very detailed but slow to compute. The second method instead uses a dynamic step-size that improves the computing time. Good agreement between both methods was achieved. Comparison with experimental results shows that charging-up plays an important role in detectors operation, explaining the time evolution of the gain. However it doesn't seem to be the only responsible for the difference between measurements and Monte Carlo simulations.
dc.identifier.citationVeenhof, R. J. vd. (2014). "A dynamic method for charging-up calculations: The case of GEM". Journal of Instrumentation, 9(7).
dc.identifier.issn1748-0221
dc.identifier.scopus2-s2.0-84905168595
dc.identifier.urihttps://doi.org/10.1088/1748-0221/9/07/P07025
dc.identifier.urihttps://iopscience.iop.org/article/10.1088/1748-0221/9/07/P07025/pdf
dc.identifier.urihttps://hdl.handle.net/11452/39903
dc.identifier.volume9
dc.identifier.wos000340050700046
dc.indexed.scopusScopus
dc.indexed.wosSCIE
dc.language.isoen
dc.publisherIOP Publishing
dc.relation.collaborationYurt dışı
dc.relation.collaborationSanayi
dc.relation.journalJournal of Instrumentation
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi
dc.rightsinfo:eu-repo/semantics/openAccess
dc.subjectAvalanche-induced secondary effects
dc.subjectCharge transport and multiplication in gas
dc.subjectDetector modelling and simulations II (electric fields charge transport multiplication and induction pulse formation electron emission etc)
dc.subjectMicropattern gaseous detectors (msgc gem thgem rethgem mhsp micropic micromegas ingrid etc)
dc.subjectIonization
dc.subjectGases
dc.subjectSimulation
dc.subjectInstruments & instrumentation
dc.subjectElectric fields
dc.subjectMonte Carlo methods
dc.subjectElectron multipliers
dc.subjectAvalanche-induced secondary effects
dc.subjectConstant step sizes
dc.subjectMonte Carlo results
dc.subjectDesign and optimization
dc.subjectModelling and simulations
dc.subjectGas electron multipliers
dc.subjectInsulator surfaces
dc.subjectGaseous detectors
dc.subjectGas detectors
dc.subject.scopusGaseous Detectors; Photomultipliers; Detector
dc.subject.wosInstruments & instrumentation
dc.titleA dynamic method for charging-up calculations: The case of GEM
dc.typeArticle
dc.wos.quartileQ2
dspace.entity.typePublication
local.contributor.departmentFen Edebiyat Fakültesi/Fizik Bölümü
local.indexed.atPubMed
local.indexed.atScopus

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