Uğuz, Agah2024-11-132024-11-132003-01-010232-1300https://doi.org/10.1002/crat.200310065https://onlinelibrary.wiley.com/doi/10.1002/crat.200310065https://hdl.handle.net/11452/47821Indexing and mapping of selected area electron channelling patterns (SAECPs) of an Al-Zn-Mg alloy have been performed. Although, channelling patterns are similar for crystals having the same system, since the interplanar spacing and the angular band width depend on lattice parameter, the details of the map will differ for every material. Angles between the poles and the angular separations of channelling bands were measured on the micrographs and calculated with the well known equations and found to be well in agreement within the error limits. Also the channelling line widths were calculated with the help of extinction distances of the reflecting planes. Structure factors and atomic scattering factors for selected reflections were also calculated for the present alloy whose a = 4.054 Angstrom.eninfo:eu-repo/semantics/closedAccessZn-mg alloysMicroscopeAreasElectron channeling patternsAlummium alloysCrystallographic parametersStemScience & technologyPhysical sciencesCrystallographyArticle00018351240001451552738610.1002/crat.200310065